SN74BCT8244ANT - IC SCAN TEST DEVICE BUFF 24-DIP

Texas Instruments
Integrated Circuits IC - Logic - Specialty Logic

IC SCAN TEST DEVICE BUFF 24-DIP
Logic Type     
Supply Voltage     
Number of Bits     
Operating Temperature     
Mounting Type     
Package / Case     
Supplier Device Package    
    
    
    
    
    
    
Scan Test Device with Buffers
4.5 V ~ 5.5 V
8
0°C ~ 70°C
Through Hole
24-DIP (0.300, 7.62mm)
24-PDIP







Interesting


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