SN74BCT8374ADW - IC SCAN TEST DEVICE W/FF 24-SOIC

Texas Instruments
Integrated Circuits IC - Logic - Specialty Logic

IC SCAN TEST DEVICE W/FF 24-SOIC
Logic Type     
Supply Voltage     
Number of Bits     
Operating Temperature     
Mounting Type     
Package / Case     
Supplier Device Package    
    
    
    
    
    
    
Scan Test Device with D-Type Edge-Triggered Flip-Flops
4.5 V ~ 5.5 V
8
0°C ~ 70°C
Surface Mount
24-SOIC (0.295, 7.50mm Width)
24-SOIC







Interesting


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