SN74LVTH182504APM - IC SCAN-TEST-DEV/XCVR 64-LQFP

Texas Instruments
Integrated Circuits IC - Logic - Specialty Logic

IC SCAN-TEST-DEV/XCVR 64-LQFP
Logic Type     
Supply Voltage     
Number of Bits     
Operating Temperature     
Mounting Type     
Package / Case     
Supplier Device Package    
    
    
    
    
    
    
ABT Scan Test Device With Universal Bus Transceivers
2.7 V ~ 3.6 V
20
-40°C ~ 85°C
Surface Mount
64-LQFP
64-LQFP (10x10)







Interesting


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